AFM Nano-indentation

Nanoindentation of samples using Atomic Force Microscopy (AFM) probes is becoming a common way of measuring micro- and nano-scopic mechanical properties. However, it is well know that this approach can produce unreliable results that vary greatly between measurements of the same material. The aim is to investigate the reasons for this variability and then design and model as new type of AFM indentation probe that will address this unreliability.