DAQ Development in Labview
Budget: ₹37,500 – ₹75,000 INR
Acquisition Mode features
Data acquisition under different operational modes
Parameter definition (measurement description, measurement type etc.)
Selection of scan and increment axes (parameters, scan direction, stepped or continuous mode)
Configuration of different connected instruments and Sensors
Storing configurations and custom settings, recalling stored configurations, saving measured data in pre-defined file formats
Real-time monitoring of acquired data with the ability to pause and save partial data set
Supports concatenated batch runs
Support for commercially available Keysight, Rohde & Schwarz and Anritsu RF instrumentation
Measurement abort on user defined critical events
Resuming unfinished measurement
Analysis Mode features
Raw data 2D/3D plotting in different formats
Mathematical Function/Data based surface generation and Surface comparison plot
Raw data filtering, smoothing, slicing, averaging
Data manipulation (re-arrange axes, merge and split data for frequency/polarization, data flipping)
Error correction in acquired data for different Fresnel near field error terms
Panel misalignment/error data export in tabulated (*.xlsx, *.csv), pdf and custom formats
Pattern phase offset/translation, phase unwrapping, coordinate rotation/transformation
Data normalization and surface plot comparison
2D and 3D plots for transformed data with zooming offset and peak search
Statistical plots and parameter computation such as Standard deviation, RMS etc.
Overlay of user pre-defined masks
Overlay of multiple data plots
Sensor control features
Real-time display of Source vibrations
Real-time display of all Temperature and Relative humidity sensors
Real-time status display of Heaters for temperature control
Audio and visual alerts for all critical user configurable system events
Logging of sensor data with time during the measurement period
Data acquisition under different operational modes
Parameter definition (measurement description, measurement type etc.)
Selection of scan and increment axes (parameters, scan direction, stepped or continuous mode)
Configuration of different connected instruments and Sensors
Storing configurations and custom settings, recalling stored configurations, saving measured data in pre-defined file formats
Real-time monitoring of acquired data with the ability to pause and save partial data set
Supports concatenated batch runs
Support for commercially available Keysight, Rohde & Schwarz and Anritsu RF instrumentation
Measurement abort on user defined critical events
Resuming unfinished measurement
Analysis Mode features
Raw data 2D/3D plotting in different formats
Mathematical Function/Data based surface generation and Surface comparison plot
Raw data filtering, smoothing, slicing, averaging
Data manipulation (re-arrange axes, merge and split data for frequency/polarization, data flipping)
Error correction in acquired data for different Fresnel near field error terms
Panel misalignment/error data export in tabulated (*.xlsx, *.csv), pdf and custom formats
Pattern phase offset/translation, phase unwrapping, coordinate rotation/transformation
Data normalization and surface plot comparison
2D and 3D plots for transformed data with zooming offset and peak search
Statistical plots and parameter computation such as Standard deviation, RMS etc.
Overlay of user pre-defined masks
Overlay of multiple data plots
Sensor control features
Real-time display of Source vibrations
Real-time display of all Temperature and Relative humidity sensors
Real-time status display of Heaters for temperature control
Audio and visual alerts for all critical user configurable system events
Logging of sensor data with time during the measurement period