defect detection using source and reference images -- 2
Budget: $30 – $250 USD
The task involves finding defects in electronic chips manufactured on silicon wafers.
Images are taken of the chips, and each chip has a corresponding reference image without defects.
The goal is to design an algorithm that can detect defects in the images by comparing them to their corresponding reference images.
The algorithm should be able to identify all the defects present in an image and produce a binary detection image that highlights the defective areas.
The quality of the solution, including the accuracy of defect detection and the ability to handle various types of defects, will be evaluated.
You can access several pairs of images (5 examples om total), including defective and non-defective examples, to develop and test your algorithm.
Images are taken of the chips, and each chip has a corresponding reference image without defects.
The goal is to design an algorithm that can detect defects in the images by comparing them to their corresponding reference images.
The algorithm should be able to identify all the defects present in an image and produce a binary detection image that highlights the defective areas.
The quality of the solution, including the accuracy of defect detection and the ability to handle various types of defects, will be evaluated.
You can access several pairs of images (5 examples om total), including defective and non-defective examples, to develop and test your algorithm.